Your selections:
A review of demodulation techniques for multifrequency atomic force microscopy
- Harcombe, David M., Ruppert, Michael G., Fleming, Andrew J.
Amplitude noise spectrum of a lock-in amplifier: application to microcantilever noise measurements
- Ruppert, Micahel G., Bartlett, Nathan J., Yong, Yuen K., Fleming, Andrew J.
High-speed demodulation in multifrequency atomic force microscopy
Design and analysis of low-distortion demodulators for modulated sensors
- Moore, Steven Ian, Ruppert, Michael G., Harcombe, David M., Fleming, Andrew J., Yong, Yuen K.
Direct design of closed-loop demodulators for amplitude modulation atomic force microscopy
- Ruppert, Michael G., Harcombe, David M., Moore, Steven I., Fleming, Andrew J.
Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy
- Harcombe, David M., Ruppert, Michael G., Ragazzon, Michael R. P., Fleming, Andrew J.
Lyapunov estimator for high-speed demodulation in dynamic mode atomic force microscopy
- Ragazzon, Michael R. P., Ruppert, Michael G., Harcombe, David M., Fleming, Andrew J., Gravdahl, Jan Tommy
Frequency domain analysis of robust demodulators for high-speed atomic force microscopy
- Ruppert, Michael G., Harcombe, David M., Ragazzon, Michael R. P., Moheimani, S. O. Reza, Fleming, Andrew J.
Analysis and application of modulated-demodulated control
- Karvinen, K. S., Moheimani, S. O. R.
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